|
|||||
Year/Semester of Study | 1 / Spring Semester | ||||
Level of Course | 2nd Cycle Degree Programme | ||||
Type of Course | Optional | ||||
Department | PHYSICS (MASTER'S DEGREE) | ||||
Pre-requisities and Co-requisites | None | ||||
Mode of Delivery | Face to Face | ||||
Teaching Period | 14 Weeks | ||||
Name of Lecturer | SEZEN AKSÖZ (sezenaksoz@nevsehir.edu.tr) | ||||
Name of Lecturer(s) | SEZEN AKSÖZ, | ||||
Language of Instruction | Turkish | ||||
Work Placement(s) | None | ||||
Objectives of the Course | |||||
The aim of the course is to learning of preparation semiconductor devices such as MS, MIS, MOS and solar cells and investigated theirs basic electrical parameters. |
Learning Outcomes | PO | MME | |
The students who succeeded in this course: | |||
LO-1 | The students who have taken this course can prepare and obtain some basic electrical parameters of MS, MIS, MOS and Solar cells . |
PO-3 Obtain new scientific knowledge and gain higher level of skills in field of search PO-4 Develop a new scientific method in the field or apply a known method to a different problem. |
Examination Presentation Term Paper |
LO-2 | to be able to learn optoelectronics devices |
PO-2 Comprehend interdisciplinary interactions and relations relevant to physics; analyze, compose, synthesize and evaluate new and complex ideas and to obtain original results by using expertise knowledge of the field PO-3 Obtain new scientific knowledge and gain higher level of skills in field of search |
Examination Presentation Term Paper |
PO: Programme Outcomes MME:Method of measurement & Evaluation |
Course Contents | ||
Crystal growth techniques, crystal imperfections, surface properties, crystallography of semiconductor, photoconductivity, amorphous semiconductors, Diodes, Detectors, Field effect transistors, Semiconductor devices, Solar cells, Optoelectronic devices. | ||
Weekly Course Content | ||
Week | Subject | Learning Activities and Teaching Methods |
1 | Crystal growth techniques | Explanation, Question-Answer |
2 | Crystal imperfections | Explanation, Question-Answer |
3 | Surface properties | Explanation, Question-Answer |
4 | Crystallography of semiconductor | Explanation, Question-Answer |
5 | Photoconductivity | Explanation, Question-Answer |
6 | Amorphous semiconductors | Explanation, Question-Answer |
7 | Amorphous semiconductors | Explanation, Question-Answer |
8 | mid-term exam | |
9 | Detectors | Explanation, Question-Answer |
10 | Field effect transistors (FET) | Explanation, Question-Answer |
11 | Semiconductor devices | Explanation, Question-Answer |
12 | Solar cells | Explanation, Question-Answer |
13 | Optoelectronic devices | Explanation, Question-Answer |
14 | Optoelectronic devices | Explanation, Question-Answer |
15 | Optoelectronic devices | Explanation, Question-Answer |
16 | final exam | |
Recommend Course Book / Supplementary Book/Reading | ||
1 | S. M. Sze, Physics of Semiconductor Devices, second ed., John Willey & Sons, New York, 1981. | |
2 | E.H. Rhoderick and R.H. Williams Metal-Semiconductor Contacts. 2nd ed. Oxford: Clarendon Press; 1988. | |
Required Course instruments and materials | ||
S. M. Sze, Physics of Semiconductor Devices, second ed., John Willey & Sons, New York, 1981. E.H. Rhoderick and R.H. Williams Metal-Semiconductor Contacts. 2nd ed.Oxford: Clarendon Press; 1988. |
Assessment Methods | |||
Type of Assessment | Week | Hours | Weight(%) |
mid-term exam | 8 | 2 | 40 |
Other assessment methods | |||
1.Oral Examination | |||
2.Quiz | |||
3.Laboratory exam | |||
4.Presentation | |||
5.Report | |||
6.Workshop | |||
7.Performance Project | |||
8.Term Paper | |||
9.Project | |||
final exam | 16 | 2 | 60 |
Student Work Load | |||
Type of Work | Weekly Hours | Number of Weeks | Work Load |
Weekly Course Hours (Theoretical+Practice) | 3 | 14 | 42 |
Outside Class | |||
a) Reading | 1 | 14 | 14 |
b) Search in internet/Library | 2 | 14 | 28 |
c) Performance Project | 0 | ||
d) Prepare a workshop/Presentation/Report | 2 | 14 | 28 |
e) Term paper/Project | 2 | 14 | 28 |
Oral Examination | 0 | ||
Quiz | 0 | ||
Laboratory exam | 0 | ||
Own study for mid-term exam | 2 | 8 | 16 |
mid-term exam | 2 | 1 | 2 |
Own study for final exam | 2 | 14 | 28 |
final exam | 2 | 1 | 2 |
0 | |||
0 | |||
Total work load; | 188 |