Nevşehir Hacı Bektaş Veli University Course Catalogue
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| Year/Semester of Study | 1 / Spring Semester | ||||
| Level of Course | 2nd Cycle Degree Programme | ||||
| Type of Course | Optional | ||||
| Department | ELECTRICAL AND ELECTRONICS ENGINEERING (MASTER) | ||||
| Pre-requisities and Co-requisites | None | ||||
| Mode of Delivery | Face to Face | ||||
| Teaching Period | 14 Weeks | ||||
| Name of Lecturer | CİHAN ÖNER (cihanoner@nevsehir.edu.tr) | ||||
| Name of Lecturer(s) | |||||
| Language of Instruction | Turkish | ||||
| Work Placement(s) | None | ||||
| Objectives of the Course | |||||
| Learning necessary techniques to characterize semiconductor materials and semiconductor based devices and understanding the importance of different physical properties related to these techniques. | |||||
| Learning Outcomes | PO | MME | |
| The students who succeeded in this course: | |||
| LO-1 | 1- To understand the physical realtionship between the material properties and different type of semiconductor devices’ working principles |
PO-3 The ability to design a complex system, process, device or product under realistic constraints and conditions to meet specific requirements; the ability to apply modern design methods for this purpose. (Realistic constraints and conditions include such issues as economy, environmental issues, sustainability, manufacturability, ethics, health, safety, social and political issues, according to the nature of design.) |
Performance Project |
| LO-2 | 2- To know how to characterize semiconductor materials and devices on different aspects |
PO-5 Ability to design experiments, conduct experiments, collect data, analyze and interpret results for examination of engineering problems. |
Performance Project |
| LO-3 | 3- To know which techniques to use for different devices according to the important physical properties of the materials that effects the working performance of the devices |
PO-2 The ability to identify, formulate, and solve complex engineering problems; selecting and applying appropriate analysis and modeling methods for this purpose. |
Performance Project |
| PO: Programme Outcomes MME:Method of measurement & Evaluation |
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| Course Contents | ||
| Introduction to Semiconductors, Resistivity Analysis, Carrier & Doping Density Analysis, Contact Resistance & Schottky Barrier Analysis, Series Resistance Analysis, Channel Length & Width, and Threshold Voltage Analysis, Defect Analysis, Oxide and Interface Trapped Charge Analysis, Oxide Thickness Analysis, Carrier Lifetime Analysis, Mobility Analysis, Charge-based and Probe Characterization, Optical Characterization, Chemical and Physical Characterization, Reliability and Failure Analysis | ||
| Weekly Course Content | ||
| Week | Subject | Learning Activities and Teaching Methods |
| 1 | Introduction to Semiconductors | Lecture, Q&A, Discussion |
| 2 | Resistivity Analysis | Lecture, Q&A, Discussion |
| 3 | Carrier and Doping Density Analysis | Lecture, Q&A, Discussion |
| 4 | Contact Resistance and Schottky Barrier Analysis | Lecture, Q&A, Discussion |
| 5 | Series Resistance, Channel Length and Width, and Threshold Voltage Analysis | Lecture, Q&A, Discussion |
| 6 | Defect Analysis | Lecture, Q&A, Discussion |
| 7 | Oxide and Interface Trapped Charges, Oxide Thickness Analysis | Lecture, Q&A, Discussion |
| 8 | mid-term exam | |
| 9 | Carrier Lifetime Analysis | Lecture, Q&A, Discussion |
| 10 | Mobility Analysis | Lecture, Q&A, Discussion |
| 11 | Charge-based and Probe Characterization | Lecture, Q&A, Discussion |
| 12 | Optical Characterization | Lecture, Q&A, Discussion |
| 13 | Chemical and Physical Characterization | Lecture, Q&A, Discussion |
| 14 | Reliability and Failure Analysis | Lecture, Q&A, Discussion |
| 15 | Summary | Lecture, Q&A, Discussion |
| 16 | final exam | |
| Recommend Course Book / Supplementary Book/Reading | ||
| 1 | 1- Semiconductor Material and Device Characterization, 3th Edition, Dieter K. Schroder, John Wiley & Sons, Inc, 2006 | |
| Required Course instruments and materials | ||
| Course Book, laptop | ||
| Assessment Methods | |||
| Type of Assessment | Week | Hours | Weight(%) |
| mid-term exam | 8 | 1 | 40 |
| Other assessment methods | |||
| 1.Oral Examination | |||
| 2.Quiz | |||
| 3.Laboratory exam | |||
| 4.Presentation | |||
| 5.Report | |||
| 6.Workshop | |||
| 7.Performance Project | |||
| 8.Term Paper | |||
| 9.Project | |||
| final exam | 16 | 1 | 60 |
| Student Work Load | |||
| Type of Work | Weekly Hours | Number of Weeks | Work Load |
| Weekly Course Hours (Theoretical+Practice) | 3 | 14 | 42 |
| Outside Class | |||
| a) Reading | 3 | 12 | 36 |
| b) Search in internet/Library | 3 | 12 | 36 |
| c) Performance Project | 0 | ||
| d) Prepare a workshop/Presentation/Report | 2 | 8 | 16 |
| e) Term paper/Project | 0 | ||
| Oral Examination | 0 | ||
| Quiz | 0 | ||
| Laboratory exam | 0 | ||
| Own study for mid-term exam | 3 | 8 | 24 |
| mid-term exam | 1 | 1 | 1 |
| Own study for final exam | 3 | 8 | 24 |
| final exam | 1 | 1 | 1 |
| 0 | |||
| 0 | |||
| Total work load; | 180 | ||